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XRD: FW1/5,4/5M method for evaluation of Grain Size Distribution - on-line calculator
Method FW1/4/5M allows for quick Grain Size Distribution (GSD) calculation. You need to specify two peak widths: measured at 1/5 and 4/5 of maximum of the diffraction peak (FW1/5M and FW4/5M, respectively). The metod takes into account only size-broadening of the diffraction maxima.
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XRD: Dyfrakcyjne badania mikrostruktury nanokryształów poddawanych działaniu wysokiego ciśnienia
Niniejsza rozprawa poswiecona jest dyfrakcji promieniowania rentgenowskiego na krysztaach nanometrowych. Zostay w niej omówione zarówno oryginalne wyniki doswiadczalne jak tez nowe podejscie teoretyczne wiazace mikrostrukture nanokrysztaów z natezeniem rozpraszanego promieniowania rentgenowskiego. Zaproponowane przez autora metody badawcze stosuja sie do analizy rozpraszania rentgenowskiego na polikrysztaach submikronowych o dowolnej strukturze krystalicznej. W tej pracy wykorzystano je do opisu i badania nanokrysztaów o strukturze najgestszego upakowania takich jak weglik krzemu, diament oraz azotek galu.
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XRD: Science24.com 2θ=>q (the scattering vector) converter
Converts diffraction file from two-theta (in plain text X-Y format) to scattering vector units
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XRD: Manual for Method FW1/5,4/5M of determination of the Grain Size Distribution from a Peak Profile of the Powder Diffraction Pattern
Manual on how to use new FW1/5,4/5M method of determination of the Grain Size Distribution from a X-Ray diffraction peak profile is presented.
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